发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH BURIED GATE
摘要 <p>PURPOSE: A method for manufacturing a semiconductor device equipped with a buried gate is provided to improve process margin of a bit line formation process by forming a bit line in a cell area before forming a peripheral gate. CONSTITUTION: A first interlayer insulating film(42) is formed on a substrate(31). A storage node contact hole(43) is formed by selectively etching the first interlayer insulating film. A storage node contact plug(44) is formed by burying the storage node contact hole with conductive material. A damascene pattern(45) is formed by selectively etching the first interlayer insulating film of a cell area. A bit line(47) is formed inside the damascene pattern. A bit line spacer is formed on a sidewall of the damascene pattern before forming the bit line. A peripheral gate is formed in a peripheral area.</p>
申请公布号 KR101156060(B1) 申请公布日期 2012.06.20
申请号 KR20100128116 申请日期 2010.12.15
申请人 SK HYNIX INC. 发明人 SHIN, JONG HAN;PARK, JUM YONG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址