发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH BURIED GATE |
摘要 |
<p>PURPOSE: A method for manufacturing a semiconductor device equipped with a buried gate is provided to improve process margin of a bit line formation process by forming a bit line in a cell area before forming a peripheral gate. CONSTITUTION: A first interlayer insulating film(42) is formed on a substrate(31). A storage node contact hole(43) is formed by selectively etching the first interlayer insulating film. A storage node contact plug(44) is formed by burying the storage node contact hole with conductive material. A damascene pattern(45) is formed by selectively etching the first interlayer insulating film of a cell area. A bit line(47) is formed inside the damascene pattern. A bit line spacer is formed on a sidewall of the damascene pattern before forming the bit line. A peripheral gate is formed in a peripheral area.</p> |
申请公布号 |
KR101156060(B1) |
申请公布日期 |
2012.06.20 |
申请号 |
KR20100128116 |
申请日期 |
2010.12.15 |
申请人 |
SK HYNIX INC. |
发明人 |
SHIN, JONG HAN;PARK, JUM YONG |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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