| 摘要 |
[PROBLEMS] To provide an electronic component testing equipment, and method of testing an electronic component, capable of shortening any time loss occurring in test tray stagnation. [MEANS FOR SOLVING PROBLEMS] Electronic component testing equipment (1) designed to test IC devices by electrical contact of IC device, while being mounted on test tray (TST), with socket (50) of test head (5) is equipped with carrier system (9) capable of circulatory delivery of test tray (TST) in a given direction within the electronic component testing equipment (1), which carrier system (9) is capable of wholly or partially delivering test tray (TST) in the direction reversed from the above given direction. |
