发明名称 |
PUSHING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND TEST HANDLER INCLUDING THE SAME |
摘要 |
PURPOSE: A pushing device for testing a semiconductor device and a test handler including the same are provided to perform a cooling test or a heating test through a single loading process by including the pushing device. CONSTITUTION: One or more pusher members(520) are installed on a plate(510). The pusher member is arranged to face an insert which stores a semiconductor device(SD) of a test tray(TT). The pusher member includes one or more heating part(550) and one or more pushing part(540). The pushing part pushes the semiconductor device to a test terminal. The heating part heats the semiconductor device. |
申请公布号 |
KR20120063576(A) |
申请公布日期 |
2012.06.18 |
申请号 |
KR20100124591 |
申请日期 |
2010.12.08 |
申请人 |
SECRON CO., LTD. |
发明人 |
LEE, JUN SEOK;LEE, JIN WHAN;KONG, KEUN TAEG |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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