发明名称 PUSHING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND TEST HANDLER INCLUDING THE SAME
摘要 PURPOSE: A pushing device for testing a semiconductor device and a test handler including the same are provided to perform a cooling test or a heating test through a single loading process by including the pushing device. CONSTITUTION: One or more pusher members(520) are installed on a plate(510). The pusher member is arranged to face an insert which stores a semiconductor device(SD) of a test tray(TT). The pusher member includes one or more heating part(550) and one or more pushing part(540). The pushing part pushes the semiconductor device to a test terminal. The heating part heats the semiconductor device.
申请公布号 KR20120063576(A) 申请公布日期 2012.06.18
申请号 KR20100124591 申请日期 2010.12.08
申请人 SECRON CO., LTD. 发明人 LEE, JUN SEOK;LEE, JIN WHAN;KONG, KEUN TAEG
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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