| 摘要 |
Disclosed is a monitoring system that includes at least one performance monitor integrated into a semiconductor die. The performance monitor comprises at least one ring oscillator that includes a plurality of stages. Each stage comprises at least one memory device. In one embodiment, the performance monitor may also include a setting circuit that has a burn-in input and an enable input. The setting circuit is capable of setting an input signal of the at least one ring oscillator to a reference voltage level. The performance monitor is configured to produce a ring delay that is characterized by a performance of the at least one memory device. The ring delay may be utilized to scale an operating voltage of the at least one memory device on the semiconductor die. |
