发明名称 OXIDE SEMIXONDUCTOR THIN FILM TRANSISTOR HAVING CONTROL/FLOATING GATE ELECTRODE AND FABRICATION METHOD THEREOF
摘要 <p>PURPOSE: An oxide semiconductor thin film transistor including control/floating gate electrodes and a manufacturing method thereof are provided to improve the reliability of a device including an oxide semiconductor transistor by programming an operation voltage to an original state through the control/floating gate electrodes even though the operation voltage is changed. CONSTITUTION: A control gate electrode(11) is formed on a substrate(10). A first gate insulation layer(12) includes a gate electrode and is formed on the substrate. A second gate insulation layer(13) is formed on the first gate insulation layer. A floating gate electrode(14) is formed on the second gate insulation layer. A third gate electrode insulation layer(15) includes the floating gate electrode and is formed on the substrate. An oxide semiconductor layer(16) comprises an oxide semiconductor and is formed on the third gate insulation layer. Source/drain electrodes(17,18) are electrically connected to the oxide semiconductor layer.</p>
申请公布号 KR20120060364(A) 申请公布日期 2012.06.12
申请号 KR20100121827 申请日期 2010.12.02
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 PARK, JONG WAN;KIM, WOONG SUN;KIM, KYUNG TAEK;MOON, YEON KEON;SHIN, SAE YOUNG;HAN, DONG SEOK
分类号 H01L29/786;H01L27/115 主分类号 H01L29/786
代理机构 代理人
主权项
地址