发明名称 Method for identifying integrated circuit that is utilized in personal digital assistant, involves determining impression of granular structure of metallic zone from digital image obtained by backscattered electron diffraction
摘要 <p>The method involves determining representative of an impression of a granular structure of a metallic zone (ZM) by determining a digital image (IM) obtained by backscattered electron diffraction (10) resulting from bombardment of the metallic zone with an electron beam. Identification information (Id) of a product (Pr) i.e. integrated circuit, is elaborated (11) from the impression, and the identification information is stored (12) in a memory (MM). The identification information includes information related to grains and/or grain boundaries of the granular structure of the metallic zone. An independent claim is also included for a method for verifying authenticity of an integrated circuit.</p>
申请公布号 FR2968455(A1) 申请公布日期 2012.06.08
申请号 FR20100060128 申请日期 2010.12.06
申请人 STMICROELECTRONICS (ROUSSET) SAS 发明人 FORNARA PASCAL;RIVERO CHRISTIAN
分类号 H01L23/544;H01L27/08 主分类号 H01L23/544
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