发明名称 |
Method for identifying integrated circuit that is utilized in personal digital assistant, involves determining impression of granular structure of metallic zone from digital image obtained by backscattered electron diffraction |
摘要 |
<p>The method involves determining representative of an impression of a granular structure of a metallic zone (ZM) by determining a digital image (IM) obtained by backscattered electron diffraction (10) resulting from bombardment of the metallic zone with an electron beam. Identification information (Id) of a product (Pr) i.e. integrated circuit, is elaborated (11) from the impression, and the identification information is stored (12) in a memory (MM). The identification information includes information related to grains and/or grain boundaries of the granular structure of the metallic zone. An independent claim is also included for a method for verifying authenticity of an integrated circuit.</p> |
申请公布号 |
FR2968455(A1) |
申请公布日期 |
2012.06.08 |
申请号 |
FR20100060128 |
申请日期 |
2010.12.06 |
申请人 |
STMICROELECTRONICS (ROUSSET) SAS |
发明人 |
FORNARA PASCAL;RIVERO CHRISTIAN |
分类号 |
H01L23/544;H01L27/08 |
主分类号 |
H01L23/544 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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