发明名称 |
INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection system capable of achieving fast focus changes. <P>SOLUTION: An inspection system includes a first focusing unit 40 that executes fast focus changes to a first focusing function applied to an incident light beam. A moving lens acousto-optic unit 50 receives a light beam focused by the first focusing function and uses multiple moving lenses generated in response to a radio-frequency signal to form a focused spot. The moving lenses apply a second focusing function, and the moving lens acousto-optic unit changes the second focusing function at a fast rate. The inspection system also includes an optical element that leads the focused spot to a position on an inspected object and leads emission from an inspected object 200 to a sensor. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012108488(A) |
申请公布日期 |
2012.06.07 |
申请号 |
JP20110230159 |
申请日期 |
2011.09.30 |
申请人 |
APPLIED MATERIALS ISRAEL LTD |
发明人 |
HAIM FELDMAN;BORIS MORGENSTERN;ADAM BAER |
分类号 |
G02B7/28;G02B7/36;G03F1/84;H01L21/66 |
主分类号 |
G02B7/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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