发明名称 Circular common-path point diffraction interference wavefront sensor
摘要 A circular common-path point diffraction interference wavefront sensor includes an optical matching system, a beam-splitter, a first reflection mirror, a second reflection mirror, a first Fourier lens, a second Fourier lens, a charge-coupled device (CCD) detector, a computer system, and a two-pinhole mask having a reference pinhole and a testing window and placed at a confocal plane of the first Fourier lens and the second Fourier lens. A testing beam is divided into two beams through the beam-splitter. One beam makes the pinhole diffraction by the reference pinhole, thereby producing the approximately ideal plane wave as the reference wave. Another beam passes through the testing window almost without any attenuation as the signal wave. The spatially linear carrier frequency is introduced by adjusting the tilt angle of the beam-splitter. The present invention is adapted for all kinds of dynamic and static detection field of wavefront phase.
申请公布号 US2012140242(A1) 申请公布日期 2012.06.07
申请号 US201113303163 申请日期 2011.11.23
申请人 FENG GUOYING;DU YONGZHAO;ZHOU SHOUHUAN;SICHUAN UNIVERSITY 发明人 FENG GUOYING;DU YONGZHAO;ZHOU SHOUHUAN
分类号 G01B9/02 主分类号 G01B9/02
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