发明名称 SEMICONDUCTOR APPARATUS AND TEST METHOD THEREOF
摘要 A semiconductor apparatus includes first and second chips sharing first and second data channels. The first chip compresses first test data of the first chip and outputs the compressed first test data through the first data channel in a first test mode, and the second chip compresses second test data of the second chip and outputs the compressed second test data through the second data channel in the first test mode.
申请公布号 US2012136611(A1) 申请公布日期 2012.05.31
申请号 US201113162726 申请日期 2011.06.17
申请人 KIM KI UP;HYNIX SEMICONDUCTOR INC. 发明人 KIM KI UP
分类号 G01R31/28;G06F19/00 主分类号 G01R31/28
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