发明名称 |
DEFLECTOR ARRAY, CHARGED PARTICLE LITHOGRAPHY APPARATUS, METHOD OF MANUFACTURING DEVICE, METHOD OF MANUFACTURING DEFLECTOR ARRAY |
摘要 |
<P>PROBLEM TO BE SOLVED: To solve such a problem that the yield worsens in the manufacture of a blanking deflector array when the number of charged particle beams increases. <P>SOLUTION: The deflector array comprises a base substrate in which multiple openings are formed, and a multiple deflector chips having multiple electrode pairs provided on both sides of at least some openings out of the multiple openings. Furthermore, the multiple deflector chips are fixed to one base substrate so that the multiple openings of the deflector chips are arranged at positions corresponding to the multiple openings of the base substrate. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012104610(A) |
申请公布日期 |
2012.05.31 |
申请号 |
JP20100251162 |
申请日期 |
2010.11.09 |
申请人 |
CANON INC |
发明人 |
YAMAZAKI TORU;KUWABARA MASAMICHI;HIRATA YOSHIHIRO |
分类号 |
H01L21/027;H01J37/147;H01J37/305 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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