发明名称 HONEYCOMB STRUCTURE INSPECTING METHOD AND HONEYCOMB STRUCTURE INSPECTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a honeycomb structure inspecting method for detecting a defect in a partition wall in a cell of a honeycomb structure. <P>SOLUTION: The honeycomb structure inspecting method treats as an inspection object a honeycomb structure 100 having porous partition walls partitioning and forming a plurality of cells which penetrate from one end face to another end face. The one end face 11 of the honeycomb structure 100 is photographed by a photograph device 21 from a direction with an angle &theta; of larger than 0 degrees and smaller than 90 degrees to the one end face 11 for inspecting the defects in the partition walls in the cells of the honeycomb structure 100. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012103187(A) 申请公布日期 2012.05.31
申请号 JP20100253528 申请日期 2010.11.12
申请人 NGK INSULATORS LTD 发明人 MIZUTANI TERUHIRO;ISEKI YOSHIHIRO;TANAKA KENSUKE
分类号 G01N21/95;G01N21/84 主分类号 G01N21/95
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