发明名称 METHOD AND APPARATUS FOR DEFECT RECOVERY
摘要 <p>A signal processing circuit includes a plurality of processing-circuit modules and a logic control circuit. The plurality of processing-circuit modules is configured to process an electrical signal. The plurality of processing-circuit modules has at least one processing parameter that is adaptively adjusted based on the electrical signal. The logic control circuit is configured to receive signals from the plurality of processing-circuit modules, validate the processing based on the received signals, and control a storage circuit to sample and store a value of the processing parameter when the processing is validated. Further, the logic control circuit is configured to control the storage circuit to maintain the value of processing parameter when the processing fails validation, and to control the storage circuit to recover the processing parameter in the plurality of processing-circuit modules to the stored value when the plurality of processingcircuit modules is disturbed by a defect.</p>
申请公布号 WO2012071332(A1) 申请公布日期 2012.05.31
申请号 WO2011US61665 申请日期 2011.11.21
申请人 MARVELL WORLD TRADE, LTD.;LICONA, ESTUARDO;MATS, OBERG 发明人 LICONA, ESTUARDO;MATS, OBERG
分类号 G11B20/10;G11B27/36 主分类号 G11B20/10
代理机构 代理人
主权项
地址