发明名称 MAGNETIC SENSOR ARRAY AND APPARATUS FOR DETECTING DEFECT USING THE MAGNETIC SENSOR ARRAY
摘要 If surface defects, near surface defects, or internal defects of a ferromagnetic substance object, a paramagnetic substance object, or a mixture object of ferromagnetic and paramagnetic substances are not quantitatively analyzed, the detected results can be differently analyzed depending on the knowledge or skill of an inspector. A defect detection apparatus according to an exemplary embodiment of the present invention includes an induced current applier, a magneto-electric converter, a signal processor, a signal converter, and a data processor. The induced current applier applies a line or surface current to an object that is to be measured by using an alternating current (AC) having a frequency varying depending on a depth to be measured. The magneto-electric converter senses a magnetic field generated from the object by the Hn e or surface current and generates a magnetic field sensing signal corresponding to a strength of the sensed magnetic field. The signal processor filters and amplifies the magnetic field sensing signal and outputs a signal corresponding to amplitude of the filtered and amplified signal. The signal converter converts the signal output from the signal processor into a digital signal. The data processor quantitatively converts an intensity of a magnetic field generated from the object into a numerical value based on the digital signal output from the signal converter.
申请公布号 EP2084524(A4) 申请公布日期 2012.05.30
申请号 EP20070793409 申请日期 2007.08.07
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, CHOSUN UNIVERSITY 发明人 LEE, JIN-YI;JUN, JONG-WOO;HWANG, JI-SEONG
分类号 G01N27/82 主分类号 G01N27/82
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