| 发明名称 |
METHOD FOR CONTROL OF DEFECTS IN TRANSPARENT CRYSTALS |
| 摘要 |
Disclosed is a method for control of defects in transparent crystals by value of power of radiation that passes through the sample along the axis. Between the sample and the device an analyzer is installed. After that the results of measurements are compared to the measurements for a reference sample. |
| 申请公布号 |
UA69942(U) |
申请公布日期 |
2012.05.25 |
| 申请号 |
UA20110010487U |
申请日期 |
2011.08.29 |
| 申请人 |
VENHER YEVHEN FEDOROVYCH;KACHUR NATALIIA VOLODYMYRIVNA;MASLOV VOLODYMYR PETROVYCH;LIAPIN OLEKSANDR MYKOLAIOVYCH |
发明人 |
VENHER YEVHEN FEDOROVYCH;KACHUR NATALIIA VOLODYMYRIVNA;MASLOV VOLODYMYR PETROVYCH;LIAPIN OLEKSANDR MYKOLAIOVYCH |
| 分类号 |
G01N21/31 |
主分类号 |
G01N21/31 |
| 代理机构 |
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