发明名称 SHALLOW HEAVILY DOPED SEMICONDUCTOR LAYER BY CYCLIC SELECTIVE EPITAXIAL DEPOSITION PROCESS
摘要 <p>The deposition method comprises providing a substrate with a first mono-crystalline zone made of a semiconductor material and a second zone made of an insulating material. During a passivation step, a passivation atmosphere is applied on the substrate so as to cover the first zone with doping impurities. During a deposition step, gaseous silicon and/or germanium precursors are introduced and a doped semiconductor film is formed. The semiconductor film is mono-crystalline over the first zone and has a different texture over the second zone. During an etching step, a chloride gaseous precursor is applied on the substrate so as to remove the semiconductor layer over the second zone.</p>
申请公布号 WO2012067625(A1) 申请公布日期 2012.05.24
申请号 WO2010US57441 申请日期 2010.11.19
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES;STMICROELECTRONICS, INC.;DESTEFANIS, VINCENT;LOUBET, NICOLAS 发明人 DESTEFANIS, VINCENT;LOUBET, NICOLAS
分类号 H01L21/00 主分类号 H01L21/00
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