发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 A method of forming a dielectric layer having an air gap to isolate adjacent wirings or a gate stack of the semiconductor device is provided. A method of fabricating a semiconductor device includes providing a semiconductor substrate on which a plurality of wirings are formed adjacent to one another and forming a dielectric layer filling an upper portion of a space between the adjacent wirings to form air gaps by a thermal chemical vapor deposition method.
申请公布号 US2012129356(A1) 申请公布日期 2012.05.24
申请号 US201213363673 申请日期 2012.02.01
申请人 KIM JIN-GYUN;KOO BON-YOUNG;HWANG KI-HYUN 发明人 KIM JIN-GYUN;KOO BON-YOUNG;HWANG KI-HYUN
分类号 H01L21/31 主分类号 H01L21/31
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