发明名称 X-RAY SPECTROSCOPIC SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray spectroscopic system capable of easily selecting and taking out a diffracted X ray of a prescribed wavelength from an X ray having continuous wavelength. <P>SOLUTION: This X-ray spectroscopic system includes: a periodic structure, when the X ray having the continuous wavelength enters at a prescribed angle, diffracting the X ray having the continuous wavelength into diffracted X rays with different diffraction angles, the diffraction angles of the diffracted X rays having a relation becoming an increasing function of the wavelengths of the diffracted X rays; and a slit for separating the diffracted X rays with different diffraction angles that are diffracted by the periodic structure and selecting and taking out the diffracted X ray with the prescribed wavelength from the diffracted X rays. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012093163(A) 申请公布日期 2012.05.17
申请号 JP20100239490 申请日期 2010.10.26
申请人 CANON INC 发明人 TAKAMOTO ATSUSHI
分类号 G01N23/20 主分类号 G01N23/20
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