发明名称 Photomask blank and photomask
摘要 A photomask blank comprises a transparent substrate (1), a light-shielding film (2) of an optionally transition metal-containing silicon material, and an etching mask film (3) of a chromium compound base material. The etching mask film consists of multiple layers (31,32) of different composition which are deposited by reactive sputtering, the multiple layers including, in combination, a first layer (31) of a material which imparts a compression stress when deposited on the substrate as a single composition layer and a second layer (32) of a material which imparts a tensile stress when deposited on the substrate as a single composition layer.
申请公布号 EP2237107(B1) 申请公布日期 2012.05.16
申请号 EP20100003481 申请日期 2010.03.30
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 INAZUKI, YUKIO;KANEKO, HIDEO;YOSHIKAWA, HIROKI
分类号 G03F1/32;G03F1/50;G03F1/54 主分类号 G03F1/32
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