发明名称 System for Calibrating In-Situ Stack Gas Analyzer
摘要 PURPOSE: A correction system of an in-situ gas analyzing system is provided to rapidly correct the linearity of a spectral performance of in-situ gas analyzing system. CONSTITUTION: A correction system of an in-situ gas analyzing system comprises a first correction cell(110), second correction cells(120A,120B) and an in-situ gas analyzing system(130). An inlet port(111), in which the reference gas of fixed concentration is inserted, is formed on one end of the first correction cell. A vent, in which the reference gas is exhausted, is formed on the other end of the first correction cell. The light source radiates the light of regularity wavelength to the first correction cell. The spectral part lights receive the light of light source and passes through the first correction cell. The spectral part measures the actual concentration of the reference gas of the first correction cell.
申请公布号 KR101139892(B1) 申请公布日期 2012.05.11
申请号 KR20100045440 申请日期 2010.05.14
申请人 发明人
分类号 G01N21/25;G01N21/93 主分类号 G01N21/25
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