发明名称 SUPPORT RING FOR SUPPORTING SEMICONDUCTOR WAFER COMPOSED OF MONOCRYSTALLINE SILICON DURING THERMAL TREATMENT, METHOD FOR THERMAL TREATMENT OF THE SEMICONDUCTOR WAFER, AND THERMALLY TREATED SEMICONDUCTOR WAFER COMPOSED OF MONOCRYSTALLINE SILICON
摘要 <P>PROBLEM TO BE SOLVED: To provide a support ring for supporting a semiconductor wafer composed of monocrystalline silicon during a thermal treatment, a method for the thermal treatment of the semiconductor wafer, and a thermally treated semiconductor wafer composed of monocrystalline silicon. <P>SOLUTION: The support ring for supporting a semiconductor wafer composed of monocrystalline silicon during a thermal treatment of the semiconductor wafer includes outer and inner lateral surfaces and a curved surface extending from the outer lateral surface to the inner lateral surface to serve for the placement of the semiconductor wafer, and the curved surface has a radius of curvature of not less than 6,000 mm and not more than 9,000 mm if designed for the placement of a 300 mm diameter semiconductor wafer, or a radius of curvature of not less than 9,000 mm and not more than 14,000 mm if designed for the placement of a 450 mm diameter semiconductor wafer. The method for the thermal treatment of the semiconductor wafer and the thermally treated semiconductor wafer composed of monocrystalline silicon are also provided. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012089842(A) 申请公布日期 2012.05.10
申请号 JP20110225983 申请日期 2011.10.13
申请人 SILTRONIC AG 发明人 ERICH DAUB;KAIS RAIMUND;MICHAEL CHRYSLER;LOCH THOMAS
分类号 H01L21/324;C30B29/06;C30B33/02;H01L21/322;H01L21/683 主分类号 H01L21/324
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