PURPOSE: A semiconductor device manufacturing method is provided to minimize a condensation phenomenon by forming a metal oxide before forming a sacrificial film. CONSTITUTION: A metal oxide and a sacrificial film are formed on a substrate(31) which includes silicon. A metal film is formed by reducing the metal oxide through a first heat treatment process. A metal silicide film(37) is formed by reacting the metal film and the silicon through a second heat treatment process(204). The substrate comprises a silicon film or a silicon-germanium film.
申请公布号
KR20120045570(A)
申请公布日期
2012.05.09
申请号
KR20100107189
申请日期
2010.10.29
申请人
SK HYNIX INC.
发明人
KIM, IN HOE;PARK, HYUNG SOON;KIM, SUNG JUN;LEE, JEONG YEOP;PARK, SEONG HO