发明名称 METEOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device manufacturing method is provided to minimize a condensation phenomenon by forming a metal oxide before forming a sacrificial film. CONSTITUTION: A metal oxide and a sacrificial film are formed on a substrate(31) which includes silicon. A metal film is formed by reducing the metal oxide through a first heat treatment process. A metal silicide film(37) is formed by reacting the metal film and the silicon through a second heat treatment process(204). The substrate comprises a silicon film or a silicon-germanium film.
申请公布号 KR20120045570(A) 申请公布日期 2012.05.09
申请号 KR20100107189 申请日期 2010.10.29
申请人 SK HYNIX INC. 发明人 KIM, IN HOE;PARK, HYUNG SOON;KIM, SUNG JUN;LEE, JEONG YEOP;PARK, SEONG HO
分类号 H01L21/24 主分类号 H01L21/24
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