发明名称 THREE DIMENSIONAL INSPECTION AND METROLOGY BASED ON SHORT PULSES OF LIGHT
摘要 A system and a method may be provided. The system may include an illumination module arranged to illuminate an object by short pulses of light that form at least one spot on the object; a collection module that comprises a sensor that is arranged to generate detection signals representative of three dimensional information about the object: and a mechanical stage that is arranged to introduce a movement between the object and at least one of the collection module and the illumination module.
申请公布号 US2012105869(A1) 申请公布日期 2012.05.03
申请号 US201113282502 申请日期 2011.10.27
申请人 GOLAN GILAD;CAMTEK LTD. 发明人 GOLAN GILAD
分类号 G01B11/24;G01N21/55 主分类号 G01B11/24
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