发明名称 THREE-DIMENSIONAL STACKED SEMICONDUCTOR INTEGRATED CIRCUIT AND TSV REPAIR METHOD THEREOF
摘要 Provided is a 3D stacked semiconductor integrated circuit including a plurality of chips coupled through a plurality of TSVs. A first chip among the plurality of chips is configured to detect and repair a defective TSV among the plurality of TSVs, and transmit repair information to remaining chips other than the first chip, and the remaining chips other than the first chip are configured to repair the defective TSV in response to the repair information.
申请公布号 US2012104388(A1) 申请公布日期 2012.05.03
申请号 US20100970923 申请日期 2010.12.16
申请人 CHOI MIN SEOK;BYEON SANG JIN;KU YOUNG JUN;HYNIX SEMICONDUCTOR INC. 发明人 CHOI MIN SEOK;BYEON SANG JIN;KU YOUNG JUN
分类号 H01L23/58;H01L21/30 主分类号 H01L23/58
代理机构 代理人
主权项
地址