发明名称 Method for manufacturing semiconductor layer and semiconductor device
摘要 An object is that a region separated from a semiconductor substrate when a supporting substrate is larger than the semiconductor substrate does not easily move. A method for manufacturing a semiconductor layer includes the steps of: irradiating a plurality of semiconductor substrates with ions to form embrittlement layers in the plurality of semiconductor substrates; forming bonding layers on respective surfaces of the plurality of semiconductor substrates; placing, over a supporting substrate, the surfaces of the plurality of semiconductor substrates on which the bonding layers are formed; placing a cover including depressed portions which house the plurality of semiconductor substrates over the plurality of semiconductor substrates; and heating the plurality of semiconductor substrates housed in the depressed portions of the cover, and thereby collecting semiconductor layers fixed to the supporting substrate, and regions separated from the plurality of semiconductor substrates along with the embrittlement layers.
申请公布号 US8168510(B2) 申请公布日期 2012.05.01
申请号 US20090546173 申请日期 2009.08.24
申请人 MORIWAKA TOMOAKI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MORIWAKA TOMOAKI
分类号 H01L21/30 主分类号 H01L21/30
代理机构 代理人
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