发明名称 |
VACUUM PROCESSING APPARATUS AND VACUUM PROCESSING METHOD |
摘要 |
PURPOSE: A vacuum processing apparatus and a method thereof are provided to reduce contamination at an inner wall in a transfer chamber since an out gas passes through and is not exposed to a non-processed wafer. CONSTITUTION: A vacuum transfer robot is placed inside a vacuum transfer chamber which connects a process chamber and a cooling chamber. The cooling room includes an exhaust unit, a gas supply unit, a pressure control unit, a support unit, and a loading board. The pressure control unit controls pressure in the cooling chamber. The loading board maintains a wafer(7) supported by the support unit to be adjacent. A temperature control unit controls temperatures on a surface of the loading board to the temperatures for cooling the wafer at high temperatures.
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申请公布号 |
KR20120040084(A) |
申请公布日期 |
2012.04.26 |
申请号 |
KR20110006172 |
申请日期 |
2011.01.21 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
KUDOU YUTAKA;TAKIKAWA HIROAKI;SHIMOMURA TAKAHIRO;ISOZAKI MASAKAZU;UEMURA TAKASHI |
分类号 |
H01L21/67;H01L21/02;H01L21/68;H01L21/683 |
主分类号 |
H01L21/67 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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