发明名称 VACUUM PROCESSING APPARATUS AND VACUUM PROCESSING METHOD
摘要 PURPOSE: A vacuum processing apparatus and a method thereof are provided to reduce contamination at an inner wall in a transfer chamber since an out gas passes through and is not exposed to a non-processed wafer. CONSTITUTION: A vacuum transfer robot is placed inside a vacuum transfer chamber which connects a process chamber and a cooling chamber. The cooling room includes an exhaust unit, a gas supply unit, a pressure control unit, a support unit, and a loading board. The pressure control unit controls pressure in the cooling chamber. The loading board maintains a wafer(7) supported by the support unit to be adjacent. A temperature control unit controls temperatures on a surface of the loading board to the temperatures for cooling the wafer at high temperatures.
申请公布号 KR20120040084(A) 申请公布日期 2012.04.26
申请号 KR20110006172 申请日期 2011.01.21
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 KUDOU YUTAKA;TAKIKAWA HIROAKI;SHIMOMURA TAKAHIRO;ISOZAKI MASAKAZU;UEMURA TAKASHI
分类号 H01L21/67;H01L21/02;H01L21/68;H01L21/683 主分类号 H01L21/67
代理机构 代理人
主权项
地址
您可能感兴趣的专利