发明名称 MEASURING APPARATUS, MEASURING METHOD, TESTING DEVICE AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To efficiently measure a target measurement signal. <P>SOLUTION: A measuring device for measuring a target measurement signal in which a waveform pattern is repeated in a predetermined cycle comprises: a sampling section configured to subject the target measurement signal to coherent sampling; and a waveform reconfiguration section configured such that among sampling data obtained by the sampling section, sampling data corresponding to the section of part of the waveform pattern are arranged in predetermined order, thereby reconfiguring only a partial waveform corresponding to the section of the part of the waveform pattern. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012083342(A) 申请公布日期 2012.04.26
申请号 JP20110199461 申请日期 2011.09.13
申请人 ADVANTEST CORP 发明人 YAMAGUCHI TAKAHIRO;DEGAWA KATSUHIKO;ISHIDA MASAHIRO;AOKI TAKAFUMI
分类号 G01R13/20;G01R29/02;G01R31/28 主分类号 G01R13/20
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