发明名称 |
MEASURING APPARATUS, MEASURING METHOD, TESTING DEVICE AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To efficiently measure a target measurement signal. <P>SOLUTION: A measuring device for measuring a target measurement signal in which a waveform pattern is repeated in a predetermined cycle comprises: a sampling section configured to subject the target measurement signal to coherent sampling; and a waveform reconfiguration section configured such that among sampling data obtained by the sampling section, sampling data corresponding to the section of part of the waveform pattern are arranged in predetermined order, thereby reconfiguring only a partial waveform corresponding to the section of the part of the waveform pattern. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012083342(A) |
申请公布日期 |
2012.04.26 |
申请号 |
JP20110199461 |
申请日期 |
2011.09.13 |
申请人 |
ADVANTEST CORP |
发明人 |
YAMAGUCHI TAKAHIRO;DEGAWA KATSUHIKO;ISHIDA MASAHIRO;AOKI TAKAFUMI |
分类号 |
G01R13/20;G01R29/02;G01R31/28 |
主分类号 |
G01R13/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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