发明名称 METHOD FOR CUTTING OBJECT TO BE PROCESSED
摘要 A silicon substrate 12 has a main face in a (100) plane, whereby a fracture 17 generated from a molten processed region 13 acting as a start point extends in a cleavage direction of the silicon substrate 12 (a direction orthogonal to the main face of the silicon substrate 12). Here, a rear face 1b of an object to be processed 1A and a front face 10a of an object to be processed for separation 10A are bonded to each other by anode bonding, whereby the fracture 17 reaches a front face 1a of the object 1A continuously without substantially changing its direction. When generating a stress in the object for separation 10A, the fracture 17 has reached a rear face 10b of the object for separation 10A and thus easily extends toward the object 1A.
申请公布号 KR20120039509(A) 申请公布日期 2012.04.25
申请号 KR20117022454 申请日期 2010.07.21
申请人 HAMAMATSU PHOTONICS K.K. 发明人 SHIMOI HIDEKI;UCHIYAMA NAOKI;KAWAGUCHI DAISUKE
分类号 B28D5/00;B23K26/00;B23K26/38;B23K26/40 主分类号 B28D5/00
代理机构 代理人
主权项
地址