DETERMINING LAYER THICKNESS USING PHOTOELECTRON SPECTROSCOPY,申请号EP20060750862-传众专利搜索

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发明名称	DETERMINING LAYER THICKNESS USING PHOTOELECTRON SPECTROSCOPY
摘要
申请公布号	EP1875485(A4)	申请公布日期	2012.04.25
申请号	EP20060750862	申请日期	2006.04.19
申请人	REVERA INCORPORATED	发明人	SCHUELER, BRUNO
分类号	H01J40/00	主分类号	H01J40/00
代理机构		代理人
主权项
地址

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