发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to uniformly etch a first conductive film regardless of a level of gap regions, thereby improving reliability of the semiconductor device. CONSTITUTION: An insulating structure which includes insulation patterns(120a,120Ua) laminated by being separated from each other is formed on a substrate. Gap regions(145L,145,145U) between the adjacent insulation patterns are defined. A first conductive film is formed by covering a sidewall of the insulating structure and filling the gap regions. A second conductive film is formed by covering the first conductive film on the sidewall of the insulating structure. The thickness of the second conductive film on the upper sidewall of the insulating structure is greater than the thickness of the second conductive film on the lower sidewall of the insulating structure.
申请公布号 KR20120038810(A) 申请公布日期 2012.04.24
申请号 KR20100100465 申请日期 2010.10.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, HAUK;LEE, BYOUNG KYU;HONG, JIN GI;LEE, CHANG WON;LEE, EUNG JOON;PARK, JE HYEON;LEE, JEONG GIL
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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