发明名称 SYSTEMS AND METHODS FOR IMAGING CHARACTERISTICS OF A SAMPLE AND FOR IDENTIFYING REGIONS OF DAMAGE IN THE SAMPLE
摘要 <p>Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample are generally described. Some example systems and methods for non-destructive evaluation of regions of material may operate in a direct current (DC) mode in which the system directly images regions of material where weak structural damage has occurred by imaging a self magnetic field generated by a DC electric current coupled through the material. Some example systems may operate in an alternating current (AC) mode to image regions of material where damage has occurred by generating a time varying magnetic field due to AC excitation coils inducing eddy currents in the sample, and imaging a magnetic field generated by the eddy currents around the regions of damage. The systems may use magneto-optical imaging techniques (MOI) to measure and map the magnetic field and channels of current flow in the material, for example.</p>
申请公布号 WO2012049538(A1) 申请公布日期 2012.04.19
申请号 WO2010IB55472 申请日期 2010.11.29
申请人 INDIAN INSTITUTE OF TECHNOLOGY KANPUR;BANERJEE, SATYAJIT;MOHAN, SHYAM;SINHA, JAIVARDHAN 发明人 BANERJEE, SATYAJIT;MOHAN, SHYAM;SINHA, JAIVARDHAN
分类号 G01N27/82;G01N21/88;G01R33/032 主分类号 G01N27/82
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