发明名称 X-RAY MEASURING DEVICE AND X-RAY MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray measuring device and an X-ray measuring method which can reduce or remove a shielding body and improve S/N ratio. <P>SOLUTION: Among X-ray detection data, detection data corresponding to time when an X-ray 4 is generated at a collision point 9 are enabled, and other data are disabled to generate X-ray waveforms. For instance, if laser light 3 is pulse laser light, and an electron beam 1 is either a continuous beam or a pulsed electron beam with pulse width the same as or longer than that of the pulse laser light, the laser light 3 is detected, the X-ray detection data and laser light detection data are multiplied with a time axis matched concerning the collision point 9 to generate the X-ray waveforms. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012078359(A) 申请公布日期 2012.04.19
申请号 JP20110240011 申请日期 2011.11.01
申请人 IHI CORP;UNIV OF TOKYO 发明人 NOSE HIROYUKI;ISHIDA ONORI;KANEKO NAMIO;SAKAI YASUO;KAMISAKA MITSURU;SAKAMOTO FUMITO;DOBASHI KATSUHIRO
分类号 G01T1/17;H05G2/00;H05H9/00 主分类号 G01T1/17
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