发明名称 HIGH-FREQUENCY MEASUREMENT DEVICE AND CALIBRATION METHOD OF HIGH-FREQUENCY MEASUREMENT DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for high-accuracy calibration of voltage and current detected by a high-frequency measurement device, and the high-frequency measurement device capable of executing the calibration. <P>SOLUTION: A preliminary step is to use values obtained by measuring three reference loads and true values of the values to calculate both a basic calibration parameter enabling low-accuracy calibration within a wide range of impedance and a quadrant-by-quadrant calibration parameter enabling high-accuracy calibration using each of four quadrants into which a range on a Smith chart is divided. A first calibration part 382 calibrates a detected voltage and current with the basic calibration parameter. A quadrant determination part 385 determines in which quadrant the impedance calculated from the calibrated voltage and current is located. A second calibration part 386 executes further calibration with the quadrant-by-quadrant calibration parameter corresponding to a determination result input from the quadrant determination part 385. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012078138(A) 申请公布日期 2012.04.19
申请号 JP20100221836 申请日期 2010.09.30
申请人 DAIHEN CORP 发明人 TANAKA RYOHEI
分类号 G01R27/02;G01R27/28;G01R35/00 主分类号 G01R27/02
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