发明名称 Method and Apparatus for Utilizing In-Situ Measurements Techniques in Conjunction with Thermoelectric Chips (TECs)
摘要 According to one aspect of the present invention, an apparatus includes a surface and a first array. The surface emits radiation, and the first array is arranged over the surface and arranged to provide cooling to the surface, the first array including a plurality of TECs. At least a first sensing arrangement is substantially integrated with the first array, wherein the first sensing arrangement is arranged to make a non-contact measurement associated with the surface. The apparatus also includes a controller arranged to obtain the non-contact measurement and to use the non-contact measurement to control the cooling provided by the first array.
申请公布号 US2012090332(A1) 申请公布日期 2012.04.19
申请号 US201113270522 申请日期 2011.10.11
申请人 发明人 PHILLIPS ALTON;OHTA AKIO;WATSON DOUGLAS C.
分类号 F25B21/02 主分类号 F25B21/02
代理机构 代理人
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