发明名称 ASSAY FOR DETERMINING EPIGENETIC PROFILES OF MARKERS OF FRAGILE X ALLELES
摘要 The present invention relates generally to an assay for the determination of epigenetic profiles, particularly epigenetic profiles associated with a pathological condition. Even more particularly, the present invention provides an assay to detect epigenetic profiles within the Fragile X Mental Retardation (FMR) genetic locus indicative of a pathoneurological condition such as pathoneurodevelopmental and pathoneurodegenerative conditions. The epigenetic profiles can also identify potential non-neurological conditions. Kits and assays for medicaments also form part of the present invention as do computer programs to monitor changes in epigenetic patterns and methods for screening for agents which modulate epigenetic modification.
申请公布号 US2012094288(A1) 申请公布日期 2012.04.19
申请号 US201013202085 申请日期 2010.02.17
申请人 GODLER DAVID;MURDOCH CHILDRENS RESEARCH INSTITUTE 发明人 GODLER DAVID
分类号 C12Q1/68;C12P19/34;G06F19/18 主分类号 C12Q1/68
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