发明名称 |
Sample investigating system and method of use |
摘要 |
A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use. |
申请公布号 |
US8159672(B1) |
申请公布日期 |
2012.04.17 |
申请号 |
US20090592015 |
申请日期 |
2009.11.19 |
申请人 |
LIPHARDT MARTIN M.;TIWALD THOMAS E.;JOHS BLAINE D.;HALE JEFFREY S.;HERZINGER CRAIG M.;GREEN STEVEN E.;HE PING;SYNOWICKI RONALD A.;WOOLLAM JOHN A.;J.A. WOOLLAM CO., INC. |
发明人 |
LIPHARDT MARTIN M.;TIWALD THOMAS E.;JOHS BLAINE D.;HALE JEFFREY S.;HERZINGER CRAIG M.;GREEN STEVEN E.;HE PING;SYNOWICKI RONALD A.;WOOLLAM JOHN A. |
分类号 |
G01J4/00 |
主分类号 |
G01J4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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