发明名称 Charged particle beam application apparatus
摘要 An apparatus capable of improving image quality by making it possible to suck specimens of different sizes electrostatically, and uniformalizing an electric field of a specimen edge portion, while suppressing increase in prime cost is provided. Specimen holding means is an electrostatic chuck, a master flat plane part surrounding a specimen of the largest size of specimen sizes, and an opening surrounding a specimen size except for the largest specimen size are included at an outer peripheral portion of the electrostatic chuck, a dummy specimen attachable to and detachable from the electrostatic chuck is included, and at a time of switching the specimen size, a dummy specimen is selected (or may be prevented from being used).
申请公布号 US8158955(B2) 申请公布日期 2012.04.17
申请号 US20100828781 申请日期 2010.07.01
申请人 MIZUOCHI MASAKI;TOMIDA SHOJI;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MIZUOCHI MASAKI;TOMIDA SHOJI
分类号 H02N13/00 主分类号 H02N13/00
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