发明名称 REAL TIME NITRIDING DEPTH MONITORING METHOD AND APPARATUS FOR PLASMA NITRIDING PROCESS
摘要 PURPOSE: A real time nitriding depth monitoring method and apparatus for plasma nitriding process are provided to predict thermal transformation by over-nitriding and to control surface hardness. CONSTITUTION: A real time nitriding depth monitoring method is as follows. The nitriding activation energy of specimen is inputted to a controller. A desired nitriding depth of specimen is inputted to the controller. The accumulated energy value is calculated by using nitrate activation energy of the furnace and the internal temperature condition of a furnace. A modeling experiment is performed to calculate experimental values according to cumulative energy numerical variables. The nitrided depth is calculated by the regression equation according to the change of the cumulative energy variables. It is monitored through the controller. The cooling of specimen is determined by a monitored nitrided depth.
申请公布号 KR20120035444(A) 申请公布日期 2012.04.16
申请号 KR20100096952 申请日期 2010.10.05
申请人 KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY 发明人 AN, KYONG JUN
分类号 C23C8/24;C23C8/36 主分类号 C23C8/24
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