发明名称 |
REAL TIME NITRIDING DEPTH MONITORING METHOD AND APPARATUS FOR PLASMA NITRIDING PROCESS |
摘要 |
PURPOSE: A real time nitriding depth monitoring method and apparatus for plasma nitriding process are provided to predict thermal transformation by over-nitriding and to control surface hardness. CONSTITUTION: A real time nitriding depth monitoring method is as follows. The nitriding activation energy of specimen is inputted to a controller. A desired nitriding depth of specimen is inputted to the controller. The accumulated energy value is calculated by using nitrate activation energy of the furnace and the internal temperature condition of a furnace. A modeling experiment is performed to calculate experimental values according to cumulative energy numerical variables. The nitrided depth is calculated by the regression equation according to the change of the cumulative energy variables. It is monitored through the controller. The cooling of specimen is determined by a monitored nitrided depth.
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申请公布号 |
KR20120035444(A) |
申请公布日期 |
2012.04.16 |
申请号 |
KR20100096952 |
申请日期 |
2010.10.05 |
申请人 |
KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY |
发明人 |
AN, KYONG JUN |
分类号 |
C23C8/24;C23C8/36 |
主分类号 |
C23C8/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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