发明名称 METHOD FOR FORMING GATE OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A gate formation method of a semiconductor device is provided to simplify a process by directly using aluminum which is a first metal instead of a first sacrificial film. CONSTITUTION: First and second recesses(102,202) are filled with a first sacrificial film. The first sacrificial film of the second recess is selectively eliminated. A first metal is deposited on an inner wall of the second recess. The first sacrificial film of the first recess is eliminated. The first and second recesses are filled with a second metal.</p>
申请公布号 KR20120035662(A) 申请公布日期 2012.04.16
申请号 KR20100097326 申请日期 2010.10.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG WON;YOON, BO UN;LEE, SEUNG JAE
分类号 H01L21/8238;H01L21/336;H01L29/78 主分类号 H01L21/8238
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