发明名称 |
METHOD FOR FORMING GATE OF SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A gate formation method of a semiconductor device is provided to simplify a process by directly using aluminum which is a first metal instead of a first sacrificial film. CONSTITUTION: First and second recesses(102,202) are filled with a first sacrificial film. The first sacrificial film of the second recess is selectively eliminated. A first metal is deposited on an inner wall of the second recess. The first sacrificial film of the first recess is eliminated. The first and second recesses are filled with a second metal.</p> |
申请公布号 |
KR20120035662(A) |
申请公布日期 |
2012.04.16 |
申请号 |
KR20100097326 |
申请日期 |
2010.10.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG WON;YOON, BO UN;LEE, SEUNG JAE |
分类号 |
H01L21/8238;H01L21/336;H01L29/78 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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