发明名称 CONTACT PROBE AND ELECTRONIC CIRCUIT TESTING DEVICE USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a contact probe with a long lifetime capable of performing a stable assembly, performing maintenance easily and inexpensively, and always performing normal measurement by having a stable contact resistance at the time of electric measurement. <P>SOLUTION: This contact probe includes a conductive plunger and a conductive spring for energizing the plunger in an axial direction. The plunger has a fitting part and a boss part and is arranged at one end or both ends of the spring, and at least one of the plungers has a sliding part to be inserted into the spring. The spring has a rough winding part, a tight winding part and a large pitch section to be locked with the boss part, and the tight winding part of the spring is arranged so as to be brought into contact with the sliding part of the plunger. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012068134(A) 申请公布日期 2012.04.05
申请号 JP20100213404 申请日期 2010.09.24
申请人 CITIZEN TOHOKU KK;CITIZEN HOLDINGS CO LTD 发明人 NAKATA TAKAFUMI;SUGANO ATSUSHI
分类号 G01R1/067;G01R1/073;G01R31/26;H01L21/66 主分类号 G01R1/067
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