METHOD OF CONTROLLING A TEST MODE OF A CIRCUIT

摘要

A test vector decode circuit includes a lockout circuit to prevent inadvertent latching of output vectors. The test vector decode circuit is driven by an additional output vector from the test vector decode circuit. The additional output vector, as well as the other output vectors, undergo at least one latching. A signal transmitted by the additional output vector as a result of the final latching activates the lockout circuit. The test vector decode circuit also receives a supervoltage signal. Only by turning off the supervoltage signal can all of the output test vectors be reset, including the additional output vector.