发明名称 CLEANING AGENT FOR SEMICONDUCTOR SUBSTRATE, METHOD OF CLEANING USING THE SAME, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A cleaning agent for a semiconductor substrate, a cleaning method using the same, and a method for manufacturing a semiconductor device are provided to eliminate or exfoliate ion-implanted resist or impurities from the surface of a semiconductor substrate. CONSTITUTION: A cleaning agent for a semiconductor substrate uses sulfuric acid, hydrogen peroxide, and alkylene carbonate. The alkylene carbonate is ethylene carbonate or propylene carbonate. A cleaning method using the cleaning agent includes a process for cleaning the semiconductor substrate based on the sulfuric acid, the hydrogen peroxide, and the alkylene carbonate. A method for manufacturing a semiconductor device includes an alkylene carbonate and hydrogen peroxide mixture or alkylene carbonate-based cleaning process and a sulfuric acid, hydrogen peroxide, and alkylene carbonate mixture-based cleaning process.</p>
申请公布号 KR20120031884(A) 申请公布日期 2012.04.04
申请号 KR20110093938 申请日期 2011.09.19
申请人 FUJIFILM CORPORATION 发明人 KAMIMURA TETSUYA
分类号 G03F7/42;C11D3/43;C11D3/44;H01L21/304 主分类号 G03F7/42
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