发明名称 Group III nitride semiconductor wafer and group III nitride semiconductor device
摘要 A group III nitride semiconductor device and a group III nitride semiconductor wafer are provided. The group III nitride semiconductor device has a channel layer comprising group III nitride-based semiconductor containing Al. The group III nitride semiconductor device can enhance the mobility of the two-dimensional electron gas and improve current characteristics. The group III nitride semiconductor wafer is used to make the group III nitride semiconductor device. The group III nitride semiconductor wafer comprises a substrate made of AlXGa1-XN (0<X&nlE;1), a first AlGaN layer made of group III nitride-based semiconductor containing Al and disposed on the substrate, and a second AlGaN layer made of group III nitride-based semiconductor having a bandgap greater than the first AlGaN layer and disposed thereon. The full width at half maximum values of X-ray rocking curves for (0002) and (10-12) planes of the first AlGaN layer are less than 1000 arcseconds.
申请公布号 US8148751(B2) 申请公布日期 2012.04.03
申请号 US20100732775 申请日期 2010.03.26
申请人 HASHIMOTO SHIN;TANABE TATSUYA;AKITA KATSUSHI;NAKAHATA HIDEAKI;AMANO HIROSHI;SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 HASHIMOTO SHIN;TANABE TATSUYA;AKITA KATSUSHI;NAKAHATA HIDEAKI;AMANO HIROSHI
分类号 H01L29/66 主分类号 H01L29/66
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