| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor laser element which can reliably suppress adhesion of contaminant to the outermost surface of the emission end face. <P>SOLUTION: A blue-violet semiconductor laser element 100 (semiconductor laser element) comprises a semiconductor laser element layer 2 having an active layer 15 and on which resonator end faces 2a and 2b are formed, and an end face coat film 8 formed on the surface of the resonator end face 2a. The end face coat film 8 includes an SiO<SB POS="POST">2</SB>film 33 and an Al<SB POS="POST">2</SB>O<SB POS="POST">3</SB>film 34 which control reflectance on the resonator end face 2a, and an SiO<SB POS="POST">2</SB>film 35 having a thickness larger than the total thickness of the SiO<SB POS="POST">2</SB>film 33 and the Al<SB POS="POST">2</SB>O<SB POS="POST">3</SB>film 34. When the wavelength of laser light emitted from the active layer 15 is λ, and the refractive index of the SiO<SB POS="POST">2</SB>film 35 is n, the thickness of the SiO<SB POS="POST">2</SB>film 35 is set to a thickness specified by m×λ/(2×n)(where, m is an integer) and is 1 μm or more. <P>COPYRIGHT: (C)2012,JPO&INPIT |
