发明名称 |
BYPASS DIODE DEVICE, METHOD FOR INSPECTING SAME, AND METHOD FOR MANUFACTURING FILM DIODE DEVICE |
摘要 |
[Problem] In conventional bypass diode devices, there have been problems in that workability is poor because diodes were installed individually for each cell in a photovoltaic device, and shortening hours worked was difficult. [Solution] In this bypass diode device (1) a plurality of diodes (5a - 5i) is formed on the upper surface of a supporting substrate (2) and connected in series. Furthermore, a plurality of terminal connection parts (4) that connect to the diodes (5a - 5i) is disposed so as to correspond with electrodes for external connections for each cell of a photovoltaic device. With this structure, the plurality of diodes (5a - 5i) is connected to the various cells of the photovoltaic device in a single installation operation, the workability for that installation improved, and shortening of the time for installation achieved. |
申请公布号 |
WO2012039332(A1) |
申请公布日期 |
2012.03.29 |
申请号 |
WO2011JP70966 |
申请日期 |
2011.09.14 |
申请人 |
SANYO ELECTRIC CO., LTD.;SANYO AMORUTON CO., LTD.;YAGIHASHI YUJI;SATOH MICHIO |
发明人 |
YAGIHASHI YUJI;SATOH MICHIO |
分类号 |
H01L31/042 |
主分类号 |
H01L31/042 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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