发明名称 BYPASS DIODE DEVICE, METHOD FOR INSPECTING SAME, AND METHOD FOR MANUFACTURING FILM DIODE DEVICE
摘要 [Problem] In conventional bypass diode devices, there have been problems in that workability is poor because diodes were installed individually for each cell in a photovoltaic device, and shortening hours worked was difficult. [Solution] In this bypass diode device (1) a plurality of diodes (5a - 5i) is formed on the upper surface of a supporting substrate (2) and connected in series. Furthermore, a plurality of terminal connection parts (4) that connect to the diodes (5a - 5i) is disposed so as to correspond with electrodes for external connections for each cell of a photovoltaic device. With this structure, the plurality of diodes (5a - 5i) is connected to the various cells of the photovoltaic device in a single installation operation, the workability for that installation improved, and shortening of the time for installation achieved.
申请公布号 WO2012039332(A1) 申请公布日期 2012.03.29
申请号 WO2011JP70966 申请日期 2011.09.14
申请人 SANYO ELECTRIC CO., LTD.;SANYO AMORUTON CO., LTD.;YAGIHASHI YUJI;SATOH MICHIO 发明人 YAGIHASHI YUJI;SATOH MICHIO
分类号 H01L31/042 主分类号 H01L31/042
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