发明名称 |
SPATIALLY RESOLVED THERMAL DESORPTION/IONIZATION COUPLED WITH MASS SPECTROMETRY |
摘要 |
A system and method for sub-micron analysis of a chemical composition of a specimen are described. The method includes providing a specimen for evaluation and a thermal desorption probe, thermally desorbing an analyte from a target site of said specimen using the thermally active tip to form a gaseous analyte, ionizing the gaseous analyte to form an ionized analyte, and analyzing a chemical composition of the ionized analyte. The thermally desorbing step can include heating said thermally active tip to above 200° C., and positioning the target site and the thermally active tip such that the heating step forms the gaseous analyte. The thermal desorption probe can include a thermally active tip extending from a cantilever body and an apex of the thermally active tip can have a radius of 250 nm or less;
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申请公布号 |
US2012074306(A1) |
申请公布日期 |
2012.03.29 |
申请号 |
US20100890225 |
申请日期 |
2010.09.24 |
申请人 |
JESSE STEPHEN;VAN BERKEL GARY J.;OVCHINNIKOVA OLGA S.;UT-BATTELLE, LLC |
发明人 |
JESSE STEPHEN;VAN BERKEL GARY J.;OVCHINNIKOVA OLGA S. |
分类号 |
H01J49/00 |
主分类号 |
H01J49/00 |
代理机构 |
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地址 |
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