发明名称 |
Self-trim and self-test of on-chip values |
摘要 |
A self-trim circuit provides a technique to trim a CUT (circuit under trim) using a LSB offset to determine the best digital value to trim the CUT. The self-trim circuit is also used to self-test the digital and analog portions of the self-trim circuitry, whereby the existence of a digital stuck at fault condition is detected. A state machine controls a digital stack to couple digital trim data to the CUT and read the output of a comparator circuit that signifies when a proper digital trim value has been used. Thereafter the proper digital trim value is stored into a nonvolatile memory. |
申请公布号 |
US8143953(B2) |
申请公布日期 |
2012.03.27 |
申请号 |
US20090455530 |
申请日期 |
2009.06.03 |
申请人 |
VON STAUDT HANS MARTIN;HUELBETA ROLF;KELLER MICHAEL;BURKHARDT HELMUT;DIALOG SEMICONDUCTOR GMBH |
发明人 |
VON STAUDT HANS MARTIN;HUELBETA ROLF;KELLER MICHAEL;BURKHARDT HELMUT |
分类号 |
H03L7/085 |
主分类号 |
H03L7/085 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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