发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 An dielectric film is formed above the semiconductor substrate. A first conductive layer is formed in the dielectric film and extending in a first direction. The first conductive layer is connected to a first select transistor. A second conductive layer formed in the dielectric film and extending in the first direction. The second conductive layer is connected to a second select transistor. A semiconductor layer is connected to both the first and second conductive layers and functioning as a channel layer of a memory transistor. A gate-insulating film is formed on the semiconductor layer. The gate-insulating film includes a charge accumulation film as a portion thereof. A third conductive layer is surrounded by the gate-insulating film.
申请公布号 US2012068256(A1) 申请公布日期 2012.03.22
申请号 US201113232492 申请日期 2011.09.14
申请人 FUKUDA RYO;IWATA YOSHIHISA;KABUSHIKI KAISHA TOSHIBA 发明人 FUKUDA RYO;IWATA YOSHIHISA
分类号 H01L29/792;H01L21/336 主分类号 H01L29/792
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