发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 A stacked body is formed on a silicon substrate by stacking a plurality of insulating films and a plurality of electrode films alternately and through-holes are formed to extend in the stacking direction. Next, gaps are formed between the electrode films using etching the insulating films via the through-holes. Charge storage layers are formed along side faces of the through-holes and inner faces of the gaps, and silicon pillars are filled into the through-holes. Thereby, a nonvolatile semiconductor memory device is manufactured.
申请公布号 KR101121297(B1) 申请公布日期 2012.03.22
申请号 KR20110050775 申请日期 2011.05.27
申请人 发明人
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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