发明名称 APPARATUS AND METHOD FOR IDENTIFYING A FAULTED PHASE IN A SHUNT CAPACITOR BANK.
摘要 <p>An apparatus and method for identifying a faulted phase in a shunt capacitor bank is disclosed. The apparatus includes a sampling circuit for sampling current or voltage signals associated with the shunt capacitor bank. A microcontroller is coupled to the sampling circuit and programmed to measure a compensated neutral point phase angle from the sampled signal, and compare the compensated neutral point phase angle with a fixed reference phase angle. The method includes sampling a current or voltage signal associated with the shunt capacitor bank, determining a compensated neutral point phase angle and comparing the compensated neutral point phase angle with a fixed reference phase.</p>
申请公布号 MX2012001408(A) 申请公布日期 2012.03.21
申请号 MX20120001408 申请日期 2010.09.07
申请人 SCHWEITZER ENGINEERING LABORATORIES, INC.* 发明人 CASPER A. LABUSCHAGNE;SATISH SAMINENI
分类号 H02H7/16 主分类号 H02H7/16
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