发明名称 |
NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, AND PATTERNING PROCESS |
摘要 |
PURPOSE: A naphthalene derivative, a manufacturing method, resist underlayer material, and resist underlayer formation method, and a pattern formation method are provided to improve etching-resistive characteristic, heat resistance, and solvent resistance. CONSTITUTION: A naphthalene derivative is represented by chemical formula 1 or 2. In the chemical formula 1, ring structured Ar1 and Ar2 respectively stand for benzene ring or naphthalene ring. n stands for arbitrary natural number which has polystyrene conversion average molecular weight of 100000 or less by gel permeation chromatography. In the chemical formula 2, the ring structured Ar1 and Ar2 stand for benzene ring or naphthalene ring. The resist lower layer film material uses the naphthalene derivative or a polymer which contains the naphthalene derivative as part of recurring unit. |
申请公布号 |
KR20120026993(A) |
申请公布日期 |
2012.03.20 |
申请号 |
KR20110091712 |
申请日期 |
2011.09.09 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
KINSHO TAKESHI;KORI DAISUKE;TAKEMURA KATSUYA;WATANABE TAKERU;OGIHARA TSUTOMU |
分类号 |
C08G61/02;C07C37/16;C07C39/17;G03F7/038 |
主分类号 |
C08G61/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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